Testing faults in embedded system application
1Research Scholar, Department of Computer Science and Application
2Assistant Professor, Department of Physics and Electronics Dr. Hari Singh Gour Central Vishwavidyalaya Saugor M.P. (INDIA)
Email:- neelsgr@rediffmail.com
In this paper we have presented an approach of testing faults in embedded system application software. Faults occur when application software communicates with the underlying components of the system. We have introduced two methods which involves dataflow analysis to identify intra-task communication and inter-task communication between specific layers in embedded systems and between software components within those layers.
Copy the following to cite this article:
NEELESH JAIN1 and ASHISH VERMA2, "Testing faults in embedded system application", Journal of Ultra Scientist of Physical Sciences, Volume 24, Issue 1, Page Number , 2016Copy the following to cite this URL:
NEELESH JAIN1 and ASHISH VERMA2, "Testing faults in embedded system application", Journal of Ultra Scientist of Physical Sciences, Volume 24, Issue 1, Page Number , 2016Available from: http://www.ultraphysicalsciences.org/paper/488/
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